Virginia CLE

Ian DelmontePrevious, Speaking Engagements

Beware of everything photoVirginia CLE,
Charlottesville, VA

April 4, 2013

Ethical Issues in Patent and Trademark Practice: A Practitioner’s Guide to the USPTO’s New Ethics Rules and Responding to OED Disciplinary Investigations – CLE Program featuring Michael E. McCabe, Jr., William R. Covey & Lisa A. Dolak